Normal view MARC view ISBD view

Deep level transient spectroscopy studies of radiation induced defects in silicon ( microform) by John Richard Troxell

By:

Publication details: Ann Arbor, Mich. University Microfilms International 1980Description: 4 microfiches ; 11 x 15 cmSubject(s):

Dissertation note: Thesis (Ph.D.) - Lehigh University, 1979

Tags from this library: No tags from this library for this title. Log in to add tags.

Average rating: 0.0 (0 votes)

Holdings
Item type	Current library	Home library	Collection	Call number	Materials specified	Copy number	Status	Date due	Barcode
TERHAD	PERPUSTAKAAN TUN SERI LANANG	PERPUSTAKAAN TUN SERI LANANG MEDIA-P. TUN SERI LANANG (ARAS 2)	-	TK7871.S55T76 1980 4mikrofis (Browse shelf(Opens below))		1	Available		00000722848

Thesis (Ph.D.) - Lehigh University, 1979

There are no comments on this title.

to post a comment.