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Deep level transient spectroscopy studies of radiation induced defects in silicon ( microform)

Troxell, John Richard

Deep level transient spectroscopy studies of radiation induced defects in silicon ( microform) by John Richard Troxell - Ann Arbor, Mich. University Microfilms International 1980 - 4 microfiches ; 11 x 15 cm.

Thesis (Ph.D.) - Lehigh University, 1979

Subjects--Topical Terms:
Silicon--Defects

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Deep level transient spectroscopy studies of radiation induced defects in silicon ( microform)

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