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Conductive atomic force microscopy : applications in nanomaterials / edited by Mario Lanza.
Publisher: Weinheim, Germany : Wiley-VCH, 2017Copyright date: ©2017.Description: xix, 359 pages : illustrations ; 25 cmContent type:- text
- unmediated
- volume
- 9783527340910
| Item type | Current library | Home library | Collection | Call number | Materials specified | Copy number | Status | Date due | Barcode | |
|---|---|---|---|---|---|---|---|---|---|---|
| AM | PERPUSTAKAAN DR ABDUL LATIFF | PERPUSTAKAAN DR ABDUL LATIFF KOLEKSI AM-P. DR ABDUL LATIFF | - | QH212.A78C746 2017 9 (Browse shelf(Opens below)) | 1 | Available | 00002237308 |
Includes bibliographical references and index.
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