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Conductive atomic force microscopy : applications in nanomaterials /

Conductive atomic force microscopy : applications in nanomaterials / edited by Mario Lanza. - xix, 359 pages : illustrations ; 25 cm.

Includes bibliographical references and index.

ISBN: 9783527340910 RM792.12

Subjects--Topical Terms:
Microscopy, Atomic Force.

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Conductive atomic force microscopy : applications in nanomaterials /

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