Deep level transient spectroscopy studies of radiation induced defects in silicon ( microform) by John Richard Troxell
Publication details: Ann Arbor, Mich. University Microfilms International 1980Description: 4 microfiches ; 11 x 15 cmSubject(s): Dissertation note: Thesis (Ph.D.) - Lehigh University, 1979| Item type | Current library | Home library | Collection | Call number | Materials specified | Copy number | Status | Date due | Barcode | |
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| TERHAD | PERPUSTAKAAN TUN SERI LANANG | PERPUSTAKAAN TUN SERI LANANG MEDIA-P. TUN SERI LANANG (ARAS 2) | - | TK7871.S55T76 1980 4mikrofis (Browse shelf(Opens below)) | 1 | Available | 00000722848 |
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| TK7868.D5F546 2003 Digital fundamentals / | TK7868.D5F546 2003 Digital fundamentals / | TK7868.D5F546 2003 Digital fundamentals / | TK7871.S55T76 1980 4mikrofis Deep level transient spectroscopy studies of radiation induced defects in silicon ( microform) | TK7871.15.F5T35 1980 4mikrofis Resistor conductor interface in thick film (Microform) | TK7871.15.S55 I46 1986 4mikrofis Transient capacitance spectroscopy of deep levels in epitaxial silicon ( microform)/ | TK7871.6.N67 2006 mikrofis Design optimisation of ring elements for broadband reflectarray antennas |
Thesis (Ph.D.) - Lehigh University, 1979
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