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Wire bonding in microelectronics / George G. Harmon

By: Contributor(s): Publication details: New York : McGraw-Hill, 2010Edition: 3rd edDescription: xx, 426 p. : ill. ; 24 cm. + 1 computer optical disc (4 3/4 in.)ISBN:
  • 9780071476232 :
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Item type Current library Home library Collection Call number Materials specified Copy number Status Date due Barcode
AM PERPUSTAKAAN LINGKUNGAN KEDUA PERPUSTAKAAN LINGKUNGAN KEDUA KOLEKSI AM-P. LINGKUNGAN KEDUA - TK7836.H373 2010 3 (Browse shelf(Opens below)) 1 Available 00002018605
MEDIA PERPUSTAKAAN LINGKUNGAN KEDUA PERPUSTAKAAN LINGKUNGAN KEDUA MEDIA-P. LINGKUNGAN KEDUA - TK7836.H373 2010 3 (Browse shelf(Opens below)) cd-rom 1 Available 00002212293

Rev. ed. of : Reliability and yield problems of wire bonding in microelectronics, 1989

Book is accompanied by 1 computer optical disc, entitled'Wire bonding in microelectronics, 3rd ed.' bearing the same call number and available at Bahagian Koleksi Media

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