| 000 | 00907nam a2200265 a 4500 | ||
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| 005 | 20250913125818.0 | ||
| 008 | 981208s1986 nyua 001 0 eng | ||
| 020 | _a6044400982 | ||
| 039 | 9 |
_a201101311706 _bzabidah _c199911101751 _dzainol _y08-18-1999 _zload |
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| 090 | _aQD506.F39 | ||
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_aQD50 _b.F39 |
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| 100 | 1 | _aFeldman, Leonard C. | |
| 245 | 1 | 0 |
_aFundamentals of surface and thin film analysis / _cby Leonard G. Feldman and James W. Mayer |
| 260 |
_aNew York : _bNorth-Holland, _c1986 |
||
| 300 |
_a352 p. : _bill. ; _ac23 cm. |
||
| 650 | 0 |
_aSurface (Technology) _xAnalysis |
|
| 650 | 0 |
_aThin films _xAnalysis |
|
| 700 | 1 |
_aMayer, J. W. _q(James W.), _d1930- |
|
| 907 |
_a.b10832786 _b2021-05-28 _c2019-11-12 |
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| 942 |
_c01 _n0 _kQD506.F39 |
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| 914 | _avtls000086492 | ||
| 991 | _aFakulti Sains Fizik dan Gunaan | ||
| 998 |
_at _b1999-05-08 _cm _da _feng _gnyu _y0 _z.b10832786 |
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| 999 |
_c85129 _d85129 |
||