| 000 | 00957nam a2200289 a 4500 | ||
|---|---|---|---|
| 005 | 20250913123048.0 | ||
| 008 | 981208s1993 xxua 00 eng | ||
| 020 |
_a0306443600 _cRM229.76 |
||
| 039 | 9 |
_a200908141542 _blaili _y08-18-1999 _zload |
|
| 040 | _aUKM | ||
| 090 | _aTK7871.85.E426 | ||
| 090 |
_aTK7871.85 _b.E426 |
||
| 245 | 0 | 0 |
_aElectron beam testing technology / _cedited by John T. L. Thong |
| 260 |
_aNew York : _bPlenum Press, _c1993 |
||
| 300 |
_a462 p. : _bill. ; _c25 cm. |
||
| 504 | _aIncludes bibliographical references and index | ||
| 650 | 0 |
_aSemiconductors _xTesting |
|
| 650 | 0 |
_aElectron beams _xIndustrial applications |
|
| 650 | 0 | _aScanning electron microscopes | |
| 700 | 1 | _aThong, John T. L. | |
| 907 |
_a.b10650362 _b2020-10-15 _c2019-11-12 |
||
| 942 |
_c01 _n0 _kTK7871.85.E426 |
||
| 914 | _avtls000067595 | ||
| 991 | _aFakulti Kejuruteraan | ||
| 998 |
_al _b1999-05-08 _cm _da _feng _gxxu _y0 _z.b10650362 |
||
| 999 |
_c66937 _d66937 |
||