| 000 | 01221nam a2200337 i 4500 | ||
|---|---|---|---|
| 005 | 20250919130349.0 | ||
| 008 | 190225t2017 gw da 001 0 eng d | ||
| 020 |
_a9783527340910 _qhardback _cRM792.12 |
||
| 039 | 9 |
_a201902271503 _badibah _y02-25-2019 _zruzini |
|
| 040 |
_aUKM _erda |
||
| 090 | _aQH212.A78C746 2017 9 | ||
| 090 |
_aQH212.A78 _bC746 2017 9 |
||
| 245 | 0 | 0 |
_aConductive atomic force microscopy : _bapplications in nanomaterials / _cedited by Mario Lanza. |
| 264 | 1 |
_aWeinheim, Germany : _bWiley-VCH, _c2017. |
|
| 264 | 4 | _a©2017. | |
| 300 |
_axix, 359 pages : _billustrations ; _c25 cm. |
||
| 336 |
_atext _2rdacontent |
||
| 337 |
_aunmediated _2rdamedia |
||
| 338 |
_avolume _2rdacarrier |
||
| 504 | _aIncludes bibliographical references and index. | ||
| 650 | 2 | _aMicroscopy, Atomic Force. | |
| 700 | 1 |
_aLanza, Mario, _eeditor. |
|
| 907 |
_a.b16688223 _b2019-11-12 _c2019-11-12 |
||
| 942 |
_c01 _n0 _kQH212.A78C746 2017 9 |
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| 914 | _avtls003644230 | ||
| 990 | _aaa | ||
| 991 | _aJabatan Diagnostik, FSK, KKL | ||
| 998 |
_ad _b2019-12-02 _cm _da _feng _ggw _y0 _z.b16688223 |
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| 999 |
_c636887 _d636887 |
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