000			01960nam a22004217i 4500
005			20250919011747.0
008			160413t20152015njua b 001 0 eng
020			_a9781118999738 _qhardback _cRM490.70
039		9	_a201608161212 _bhaiyati _c201608021044 _dhamudah _y04-13-2016 _zhamudah
040			_aBTCTA _beng _cBTCTA _erda _dBDX _dYDXCP _dOCLCO _dOCLCF _dCOP _dJHE _dOCLCQ _dDLC _dUKM _erda
090			_aQ327.B734 3
090			_aQ327 _b.B734 3
100	1		_aBraga-Neto, Ulisses de Mendonca, _eauthor.
245	1	0	_aError estimation for pattern recognition / _cUlisses M. Braga-Neto, Edward R. Dougherty.
264		1	_aPiscataway, NJ _bIEEE Press ; _aHoboken, Jersey : _bWiley, _c[2015].
264		4	_c©2015.
300			_axxii, 311 pages : _billustrations ; _c24 cm.
336			_atext _2rdacontent
337			_aunmediated _2rdamedia
338			_avolume _2rdacarrier
504			_aIncludes bibliographical references (pages 291-300) and indexes.
650		0	_aPattern recognition systems.
650		0	_aOptical pattern recognition.
650		0	_aPattern perception _xMathematics.
650		0	_aError analysis (Mathematics).
700	1		_aDougherty, Edward R., _eauthor.
856	4	2	_3Contributor biographical information _uhttp://www.loc.gov/catdir/enhancements/fy1606/2015458811-b.html
856	4	2	_3Publisher description _uhttp://www.loc.gov/catdir/enhancements/fy1606/2015458811-d.html
856	4	1	_3Table of contents only _uhttp://www.loc.gov/catdir/enhancements/fy1606/2015458811-t.html
907			_a.b16310019 _b2019-11-12 _c2019-11-12
942			_c01 _n0 _kQ327.B734 3
914			_avtls003604407
990			_anh
991			_aFakulti Kejuruteraan dan Alam Bina
998			_al _b2016-01-04 _cm _da _feng _gnju _y0 _z.b16310019
999			_c608533 _d608533