| 000 | 01293nam a2200349 a 4500 | ||
|---|---|---|---|
| 005 | 20250918130305.0 | ||
| 008 | 110408s2010 nyua 001 0 eng | ||
| 020 |
_a9781606500415 _cRM233.94 |
||
| 039 | 9 |
_a201111211453 _bbaizura _c201110271613 _dfarid _y04-08-2011 _zfarid |
|
| 040 |
_aYDXCP _cYDXCP _dKKS _dCIN _dUKM |
||
| 090 | _aQC611.8.C64C484 | ||
| 090 |
_aQC611.8.C64 _bC484 |
||
| 245 | 0 | 0 |
_aCharacterization in compound semiconductor processing / _ceditors, Yale Strausser and Gary E. McGuire. |
| 246 | 3 | 0 | _aCompound semiconductor processing. |
| 260 |
_aNew York: _bMomentum Press , _c2010. |
||
| 300 |
_axvi, 199 p. : _bill. ; _c25 cm |
||
| 490 | _aMaterials characterization series. | ||
| 500 | _a'First published by Butterworth-Heinemann in 1995'. | ||
| 504 | _aIncludes bibliographical references and index. | ||
| 650 | 0 | _aCompound semiconductors. | |
| 650 | 0 |
_aCompound semiconductors _xSurfaces. |
|
| 700 | 1 | _aStrausser, Yale. | |
| 700 | 1 | _aMcGuire, G. E. | |
| 830 | _aMaterials characterization series. | ||
| 907 |
_a.b1499317x _b2021-05-28 _c2019-11-12 |
||
| 942 |
_c01 _n0 _kQC611.8.C64C484 |
||
| 914 | _avtls003461477 | ||
| 990 | _anm | ||
| 991 | _aFakulti Sains dan Teknologi - FST | ||
| 998 |
_at _b2011-08-04 _cm _da _feng _gnyu _y0 _z.b1499317x |
||
| 999 |
_c484100 _d484100 |
||