000 01223nam a22003255a 4500
005 20250918130136.0
008 110321s2010 si a b 001 0 eng d
020 _a9789814273329 (hbk.)
_cRM302.94
020 _a9814273325 (hbk.)
039 9 _a201106161233
_brosli
_c201106071130
_drasyilla
_y03-21-2011
_zrasyilla
040 _aUKM
090 _aTK7874.76.T34 3
090 _aTK7874.76
_b.T34
100 1 _aTan, Cher Ming,
_d1959-
245 1 0 _aElectromigration in ULSI Interconnections /
_cCher Ming Tan.
260 _aSingapore ;
_bWorld Scientific,
_c2010.
300 _axix, 291 p. :
_bill. ;
_c24 cm.
490 1 _aInternational series on advances in solid state electronics and technology
504 _aIncludes bibliographical references and index.
650 0 _aIntegrated circuits
_xUltra large scale integration.
650 0 _aElectrodiffusion.
830 0 _aInternational series on advances in solid state electronics and technology.
907 _a.b14977710
_b2021-05-28
_c2019-11-12
942 _c01
_n0
_kTK7874.76.T34 3
914 _avtls003459850
990 _ark4
991 _aFakulti Kejuruteraan dan Alam Bina
998 _al
_b2011-08-03
_cm
_da
_feng
_gsi
_y0
_z.b14977710
999 _c482574
_d482574