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| 008 | 110321s2010 si a b 001 0 eng d | ||
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_a9789814273329 (hbk.) _cRM302.94 |
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| 090 | _aTK7874.76.T34 3 | ||
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| 100 | 1 |
_aTan, Cher Ming, _d1959- |
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_aElectromigration in ULSI Interconnections / _cCher Ming Tan. |
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_aSingapore ; _bWorld Scientific, _c2010. |
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| 300 |
_axix, 291 p. : _bill. ; _c24 cm. |
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| 490 | 1 | _aInternational series on advances in solid state electronics and technology | |
| 504 | _aIncludes bibliographical references and index. | ||
| 650 | 0 |
_aIntegrated circuits _xUltra large scale integration. |
|
| 650 | 0 | _aElectrodiffusion. | |
| 830 | 0 | _aInternational series on advances in solid state electronics and technology. | |
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_a.b14977710 _b2021-05-28 _c2019-11-12 |
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_c01 _n0 _kTK7874.76.T34 3 |
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| 991 | _aFakulti Kejuruteraan dan Alam Bina | ||
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_al _b2011-08-03 _cm _da _feng _gsi _y0 _z.b14977710 |
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