000 01417nam a2200349 a 4500
005 20250918124743.0
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007 cr nn 008maaau
008 101230s2010 mau s j eng d
020 _a9781441909282
_qelectronic book
039 9 _y12-30-2010
_zmuhaimin
090 _aTK7874
_b.P887 2010
245 0 0 _aPower-aware testing and test strategies for low power devices
_h[electronic resource] /
_cedited by Patrick Girard, Nicola Nicolici, Xiaoqing Wen.
260 _aBoston, MA :
_bSpringer Science+Business Media, LLC,
_c2010.
300 _a1online resource (382 pages) :
_billustrations, digital.
650 0 _aLow voltage integrated circuits
_xPower supply.
650 0 _aLow voltage integrated circuits
_xTesting.
650 2 4 _aCircuits and Systems.
650 2 4 _aComputer-Aided Engineering (CAD, CAE) and Design.
700 1 _aGirard, Patrick,
_eeditor.
700 1 _aNicolici, Nicola,
_eeditor.
700 1 _aWen, Xiaoqing,
_eeditor.
710 2 _aSpringerLink (Online service)
773 0 _tSpringer eBooks
856 4 0 _uhttps://eresourcesptsl.ukm.remotexs.co/user/login?url=http://dx.doi.org/10.1007/978-1-4419-0928-2
907 _a.b1489693x
_b2023-11-29
_c2019-11-12
942 _n0
_kTK7874 .P887 2010
914 _avtls003451428
998 _ae0001
_b2010-04-12
_cm
_dz
_feng
_gmau
_y0
_z.b1489693x
999 _c476253
_d476253