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_aAtomic force microscopy in process engineering : _bintroduction to AFM for improved processes and products / _c[edited by] W. Richard Bowen and Nidal Hilal |
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_aOxford : _bButterworth-Heinemann, _c2009 |
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_axvi, 283 p. : _bill. ; _c24 cm. |
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| 650 | 0 | _aAtomic force microscopy | |
| 650 | 0 | _aProduction engineering | |
| 700 | 1 | _aBowen, W. Richard | |
| 700 | 1 | _aHilal, Nidal | |
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_a.b14879736 _b2021-05-28 _c2019-11-12 |
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