000 01078cam a2200313 a 4500
005 20250918005646.0
008 090610s2009 flua bi 001 0 eng
020 _a9781420042948
_cRM235.94
020 _a1420042947 (alk. paper)
039 9 _a200908241056
_bariff
_c200908241051
_dariff
_c200907281054
_drahah
_c200906101524
_dbinar
_y06-10-2009
_zbinar
040 _aUKM
090 _aTA410.Z483 3
090 _aTA410
_b.Z483
100 1 _aZhang, Sam
245 1 0 _aMaterials characterization techniques /
_cSam Zhang, Lin Li, Ashok Kumar
260 _aBoca Raton :
_bCRC Press,
_c2009
300 _a328 p. :
_bill. ;
_c25 cm.
504 _aIncludes bibliographical references and index
650 0 _aMaterials
_xTesting
700 1 _aLi, L.
_q(Lin),
_d1959-
700 1 _aKumar, Ashok,
_d1962-
907 _a.b1450134x
_b2020-10-15
_c2019-11-12
942 _c01
_n0
_kTA410.Z483 3
914 _avtls003409693
990 _amaa
991 _aInstitut Kejuruteraan Mikro & Nanoelektronik (IMEN)
998 _al
_b2009-10-06
_cm
_da
_feng
_gflu
_y0
_z.b1450134x
999 _c442518
_d442518