| 000 | 01597nam a22004095a 4500 | ||
|---|---|---|---|
| 005 | 20250914164722.0 | ||
| 006 | m d | ||
| 007 | cr nn 008maaau | ||
| 008 | 090217s2005 mau j eng d | ||
| 020 | _a9780387263519 (electronic bk.) | ||
| 020 | _a9780387249933 (paper) | ||
| 035 | _a(Springer)978-0-387-24993-3 | ||
| 039 | 9 |
_a200902171214 _bmuhaimin _c200902171155 _dmuhaimin _c200902021310 _dmuhaimin _c200809161716 _dmuhaimin _y04-03-2008 _zmuhaimin |
|
| 050 | 0 | 0 |
_aTK7874 _b.H85 2005 |
| 082 | 0 | 0 |
_a621.381548 _222 |
| 090 |
_aTK7874 _b.H899 2005 |
||
| 100 | 1 | _aHuisman, Leendert M. | |
| 245 | 1 | 0 |
_aData Mining and Diagnosing IC Fails _h[electronic resource] / _cby Leendert M. Huisman. |
| 260 |
_aBoston, MA : _bSpringer Science+Business Media, Inc., _c2005. |
||
| 300 |
_a270 p. : _bill., digital ; _c24 cm. |
||
| 440 | 0 |
_aFrontiers in Electronic Testing, _x0929-1296 ; _v31 |
|
| 650 | 0 |
_aIntegrated circuits _xTesting _xStatistical methods. |
|
| 650 | 0 |
_aSemiconductors _xFailures. |
|
| 650 | 0 | _aData mining. | |
| 650 | 1 | 4 | _aEngineering. |
| 650 | 2 | 4 | _aElectronics and Microelectronics, Instrumentation. |
| 650 | 2 | 4 | _aCircuits and Systems. |
| 710 | 2 | _aSpringerLink (Online service) | |
| 773 | 0 | _tSpringer e-books | |
| 856 | 4 | 0 | _uhttps://eresourcesptsl.ukm.remotexs.co/login?url=http://dx.doi.org/10.1007/b137446 |
| 907 |
_a.b14113107 _b2022-04-06 _c2019-11-12 |
||
| 942 |
_n0 _kTK7874 .H899 2005 |
||
| 914 | _avtls003368727 | ||
| 998 |
_ae _b2008-03-04 _cm _dz _feng _gmau _y0 _z.b14113107 |
||
| 999 |
_c407291 _d407291 |
||