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| 008 | 090217s2005 mau j eng d | ||
| 020 | _a9780387260167 (electronic bk.) | ||
| 020 | _a9780387258003 (paper) | ||
| 035 | _a(Springer)978-0-387-25800-3 | ||
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| 100 | 1 | _aEgerton, Ray F.. | |
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_aPhysical Principles of Electron Microscopy _h[electronic resource] : _bAn Introduction to TEM, SEM, and AEM / _cby Ray F. Egerton. |
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_aBoston, MA : _bSpringer Science+Business Media, Inc., _c2005. |
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| 300 |
_axii, 202 p. : _bill., digital ; _c25 cm. |
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| 650 | 0 | _aElectron microscopy. | |
| 650 | 1 | 4 |
_aChemistry. _959425 |
| 650 | 2 | 4 | _aCharacterization and Evaluation Materials. |
| 650 | 2 | 4 | _aBiological Microscopy. |
| 710 | 2 | _aSpringerLink (Online service) | |
| 773 | 0 | _tSpringer e-books | |
| 856 | 4 | 0 | _uhttps://eresourcesptsl.ukm.remotexs.co/login?url=http://dx.doi.org/10.1007/b136495 |
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