000			01376cam a22003374a 4500
005			20250914143515.0
008			050427s2005 xxua bi 001 0 eng
020			_a0471383767 (acid-free paper) _cRM406.82
039		9	_a201310072032 _blan _c200608031237 _djamil _c200607191931 _didah _c200605222005 _dzakir _y05-22-2006 _zzakir
040			_dUKM
090			_aQA274.42.L694
090			_aQA274.42 _b.L694
100	1		_aLowen, Steven Bradley, _d1962-
245	1	0	_aFractal-based point processes / _cSteven Bradley Lowen, Malvin Carl Teich.
260			_aHoboken, N.J. : _bWiley-Interscience, _c2005.
300			_axxiv, 594 p. : _bill. ; _c24 cm.
504			_aIncludes bibliographical references (p. 513-565) and index.
650		0	_aPoint processes.
650		0	_aFractals.
700	1		_aTeich, Malvin Carl.
856	4	1	_3Table of contents _uhttp://www.loc.gov/catdir/toc/fy0602/2005048977.html.
856	4	2	_3Contributor biographical information _uhttp://www.loc.gov/catdir/enhancements/fy0625/2005048977-b.html.
856	4	2	_3Publisher description _uhttp://www.loc.gov/catdir/enhancements/fy0625/2005048977-d.html.
907			_a.b13734386 _b2021-05-28 _c2019-11-12
942			_c01 _n0 _kQA274.42.L694
914			_avtls003327727
990			_ajj
991			_aInstitut Sains Angkasa
998			_at _b2006-09-05 _cm _da _feng _gxxu _y0 _z.b13734386
999			_c371845 _d371845