| 000 | 00979 am a2200301 a 4500 | ||
|---|---|---|---|
| 005 | 20250914122500.0 | ||
| 008 | 020314s1999 enk 00 | eng | ||
| 010 | _a00-266150 | ||
| 020 | _a3527296573 | ||
| 039 | 9 |
_a201210040917 _byah _c200207040904 _ddin _y07-04-2002 _zdin |
|
| 050 | 0 | 0 |
_aTA417.25 _b.X729 |
| 090 | _aTA417.215.X729 3 | ||
| 245 | 0 | 0 |
_aX-ray characterization of materials / _cEric Lifshin (ed.) |
| 260 |
_aWeinheim : _bWiley-VCH, _c1999 |
||
| 300 |
_axvi, 261 p. : _bill. ; _c25 cm. |
||
| 504 | _aIncludes bibliographical references and index. | ||
| 650 | 0 |
_aMaterials _xAnalysis. |
|
| 650 | 0 |
_aSurfaces (Technology) _xAnalysis |
|
| 650 | 0 |
_aX-rays _xIndustrial applications |
|
| 700 | 1 | _aLifshin, Eric. | |
| 907 |
_a.b12993657 _b2019-11-12 _c2019-11-12 |
||
| 942 |
_c01 _n0 _kTA417.215.X729 3 |
||
| 914 | _avtls000311426 | ||
| 990 | _asbs | ||
| 991 | _aProgram Sains Bahan | ||
| 998 |
_al _b2002-04-07 _cm _da _feng _genk _y0 _z.b12993657 |
||
| 999 |
_c299743 _d299743 |
||