000 01013aam a2200289 a 4500
005 20250914014148.0
008 981208s1973 xxua b 001 eng d
020 _a0471720305
039 9 _a201904030859
_bhamka
_c200109241048
_dasmany
_c200108081847
_dbedah
_y08-18-1999
_zload
090 _aTK7871.85.R466
090 _aTK7871.85
_b.R466
100 1 _aRichman, Paul
245 1 0 _aMOS field-effect transistors and integrated circuits /
_cPaul Richman
260 _aNew York :
_bJohn Wiley & Sons,
_c1973
300 _aix, 259 p. :
_bill. ;
_c23 cm.
500 _a'A Wiley-Interscience publication.'
504 _aIncludes bibliographical references and index
650 0 _aMetal oxide semiconductors
650 0 _aField-effect transistors
650 0 _aIntegrated circuits
907 _a.b11520838
_b2021-05-28
_c2019-11-12
942 _c01
_n0
_kTK7871.85.R466
914 _avtls000157656
991 _aFakulti Kejuruteraan
998 _at
_b1999-05-08
_cm
_da
_feng
_gxxu
_y0
_z.b11520838
999 _c153743
_d153743