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| 100 | 1 | _aFerris-Prabhu, Albert V. | |
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_aIntroduction to semiconductor device yield modeling / _cAlbert V. Ferris-Prabhu. |
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_aBoston : _bArtech House, _c1992. |
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_axii, 91 p. : _bill. ; _c24 cm. |
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_aSemiconductors _xDefects. |
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_aSemiconductor industry _xQuality control. |
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_a.b11130271 _b2021-05-28 _c2019-11-12 |
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| 991 | _aFakulti Kejuruteraan | ||
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