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1.
Auger microprobe analysis / I. F. Ferguson by
Publication details: Bristol : Adam Hilger, 1989
Availability: Items available for loan: PERPUSTAKAAN TUN SERI LANANG (1)Call number: QH324.9.M5F47.

2.
Electron and ion microscopy and microanalysis : principles and applications / Lawrence E. Murr by Series: Optical engineering ; v. 1
Publication details: New York : Marcel Dekker, 1982
Availability: Items available for loan: PERPUSTAKAAN TUN SERI LANANG (1)Call number: QH212.E4M87.

3.
Electron microprobe analysis / S. J. B. Reed by
Publication details: Cambridge : Cambridge University Press, 1975
Availability: Items available for loan: PERPUSTAKAAN TUN SERI LANANG (1)Call number: QD117.E4R43.

4.
Electron microprobe analysis and scanning electron microscopy in geology / S. J. B. Reed by
Publication details: Cambridge : Cambridge University Press, 1996
Availability: Items available for loan: PERPUSTAKAAN TUN SERI LANANG (1)Call number: QE440.R43.

5.
Microprobe analysis / edited by C. A. Andersen. by
Publication details: New York : Wiley, 1973
Availability: Items available for loan: PERPUSTAKAAN TUN SERI LANANG (2)Call number: QD98.A48, ...

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Microprobe techniques in the earth sciences / edited by Philip J. Potts ... et al. by Series: Minerological Society series ; 6
Publication details: London : Chapman & Hall, 1995
Availability: Items available for loan: PERPUSTAKAAN TUN SERI LANANG (2)Call number: QE516.3.M53, ...

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Practical scanning electron microscopy : electron and ion microprobe analysis / edited by Joseph I. Goldstein and Harvey Yakowitz forward by T.E. Everhart. by
Publication details: New York : Plenum Press, 1975
Availability: Items available for loan: PERPUSTAKAAN DR ABDUL LATIFF (1)Call number: QH212.S3 .P895 1975 9. PERPUSTAKAAN TUN SERI LANANG (1)Call number: QH212.S3P7.

11.
Problem solving with microbeam analysis / Klara Kiss by Series: Studies in analytical chemistry ; 7
Publication details: Amsterdam : Elsevier North-Holland, 1988
Availability: Items available for loan: PERPUSTAKAAN LINGKUNGAN KEDUA (1)Call number: TA417.23.K57.

12.
Microprobe characterization of optoelectronic materials / edited by Juan Jimenez. by Series: Optoelectronic properties of semiconductors and superlattices ; vol. 17.
Publication details: New York : Taylor & Francis, 2003
Availability: Items available for loan: PERPUSTAKAAN TUN SERI LANANG (1)Call number: QC611.6.O6M52.

13.
Fabrication of silicon microprobes for optical near-field applications / Phan Ngoc Minh, Ono Takahito, Esashi Masayoshi by
Publication details: Boca Raton, Fla. : CRC Press, 2002
Availability: Items available for loan: PERPUSTAKAAN LINGKUNGAN KEDUA (1)Call number: TJ1191.5.M563 pasca.

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