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1.
Hot-carrier reliability of MOS VLSI circuits / by Yusuf Leblebici, Sung-Mo (Steve) Kang. by
Publication details: Boston, Mass. : Kluwer Academic Publishers, 1993
Availability: Items available for loan: PERPUSTAKAAN LINGKUNGAN KEDUA (1)Call number: TK7874.L334.

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Hot-electron effects in MOSFET's (microform) by Ping Keung Ko by
Publication details: Ann Arbor, Mich. University Microfilms International 1983
Dissertation note: Thesis (Ph.D.)-University of California, 1982
Availability: Items available for loan: PERPUSTAKAAN TUN SERI LANANG (1)Call number: TK7871.95.K6 1983 4mikrofis.

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Microwave noise in semiconductor devices / Hans Ludwig Hartnagel, Ramunas Katilius, Arvydas Matulionis by
Publication details: New York : Wiley, 2001
Availability: Items available for loan: PERPUSTAKAAN LINGKUNGAN KEDUA (1)Call number: TK7867.5.H37.

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4.
Balance equation approach to electron transport in semiconductors / X. L. Lei. by Series: Frontiers of research with the Chinese Academy of Sciences ; v. 2
Publication details: Singapore : World Scientific, 2008
Availability: Items available for loan: PERPUSTAKAAN LINGKUNGAN KEDUA (1)Call number: QC611.6.E45 L453 3.

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