Your search returned 10 results.

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	1.	No cover image available ATE : automatic test equipment / Allan C. Stover by Stover, Allan C Publication details: New York : McGraw-Hill Book, 1984 Availability: Items available for loan: PERPUSTAKAAN LINGKUNGAN KEDUA (1)Call number: TK7895.A8S86 3[00006004873]. Place hold
	2.	Automated materials handling : proceedings of the 1st Internatio- nal Conference / edited by R.H.Hoolier by International Conference on Automated Materials Handling (1st : 1983 : London) Hollier, R.H Publication details: London : IFS (Publication), 1983 Availability: Items available for loan: PERPUSTAKAAN LINGKUNGAN KEDUA (1)Call number: T59.5.I57 1983. Place hold
	3.	Automatic testing systems and applications Roy Knowles by Knowles, R Publication details: London McGraw-Hill 1976 Availability: Items available for loan: PERPUSTAKAAN LINGKUNGAN KEDUA (1)Call number: TK7895.A8K56 3[00006004874]. Place hold
	4.	No cover image available BIST Signature Analysis ( microform) : analytical techniques for computing the probability of aliasing / Andre Ivanov by Ivanov, Andre Publication details: Ottawa : National Library of Canada, 1990 Dissertation note: Thesis (Ph.D.)-McGill University, 1989 Availability: Items available for loan: PERPUSTAKAAN TUN SERI LANANG (1)Call number: TK7895.A8I92 1990 4mikrofis. Place hold
	5.	Competent expert systems : a case study in fault diagnosis / E. T. Keravnou & L. Johnson by Keravnou, E. T Johnson, L Publication details: London : Kogan Page, 1986 Availability: Items available for loan: PERPUSTAKAAN LINGKUNGAN KEDUA (1)Call number: QA76.76.E95K44 3 [00006002427]. Place hold
	6.	Competent expert systems : a case study in fault diagnosis / E. T. Keravnou, L. Johnson. by Keravnou, E. T Johnson, L Publication details: New York : McGraw-Hill Book, 1986 Availability: Items available for loan: PERPUSTAKAAN LINGKUNGAN KEDUA (1)Call number: QA76.76.E95K44 1986b 3 [00006002428]. PERPUSTAKAAN TUN SERI LANANG (1)Call number: QA76.76.E95K44 1986b. Place hold
	7.	Failure diagnosis and performance monitoring / L.F. Pau by Pau, L- F. (Louis-Francais), 1948- Series: Control and systems theory ; v.11 Publication details: New York : M. Dekker, 1981 Availability: Items available for loan: PERPUSTAKAAN LINGKUNGAN KEDUA (1)Call number: TS173.P3813 3. Place hold
	8.	Neural models and algorithms for digital testing / by Srimat T. Chakradhar, Vishwani D. Agrawal, Michael L. Bushnell. by Chakradhar, Srimat T Agrawal, Vishwani D, 1943- Bushnell, Michael L., (Michael Lee), 1950- Publication details: Boston : Kluwer Academic Publishers, 1991 Availability: Items available for loan: PERPUSTAKAAN LINGKUNGAN KEDUA (1)Call number: TK7868.L6 C44. Place hold
	9.	Rational fault analysis proceedings of the Symposium on Rational Fault Analysis held at Texas Tech University August 19-20, 1974 edited by Richard Sacks, Stanley R. Liberty by Symposium on Rational Fault Analysis (1974 : Texas) Saeks, Richard Liberty, Stanley R, b.1942 Symposium on Rational Fault Analysis (1974 : Texas Tech University, Lubbock, Texas) United States. Army Research Office Series: Electrical engineering and electronics ; 1 Publication details: New York M. Dekker 1977 Availability: Items available for loan: PERPUSTAKAAN TUN SERI LANANG (1)Call number: TK7870.S945 1974. Place hold
	10.	Tutorial, test generation for VLSI chips edited by Vishwani D. Agrawal and Sharad C. Seth by Agrawal, Vishwani D, 1943- Seth, Sharad C IEEE Computer Society Publication details: Washington, D.C. IEEE computer Society 1988 Availability: Items available for loan: PERPUSTAKAAN LINGKUNGAN KEDUA (1)Call number: TK7874.T8857. Place hold

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