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Lifetime Spectroscopy [electronic resource] : A Method of Defect Characterization in Silicon for Photovoltaic Applications / by Stefan Rein.

By: Contributor(s): Series: Springer Series in Material Science ; 85Publication details: Berlin, Heidelberg : Springer-Verlag Berlin Heidelberg, 2005.Description: xxvi, 489 p. : ill., digital ; 25 cmISBN:
  • 9783540279228 (electronic bk.)
  • 9783540253037 (paper)
Subject(s): DDC classification:
  • 537 22
LOC classification:
  • TK7871.15.S55 R45 2005
Online resources: In: Springer e-books
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