Your search returned 12 results.

Results
	1.	Economics of electronic design, manufacture and test / edited by Magdy Abadir, Tony Ambler by Abadir, M Ambler, Tony Series: Frontiers in electronic testing Publication details: Boston : Kluwer Academic Publishers, 1994 Availability: Items available for loan: PERPUSTAKAAN LINGKUNGAN KEDUA (1)Call number: TK7867.E173. Place hold
	2.	Oscillation-based test in mixed-signal circuits / by Gloria Huertas Sanchez ... [et al.] by Sanchez, Gloria Huertas Series: Frontiers in electronic testing ; 36 Publication details: Dordrecht : Springer, 2006 Online resources: Table of contents only Availability: Items available for loan: PERPUSTAKAAN LINGKUNGAN KEDUA (1)Call number: TK7874.58.O83 3. Place hold
	3.	Data Mining and Diagnosing IC Fails [electronic resource] / by Leendert M. Huisman. by Huisman, Leendert M SpringerLink (Online service) Series: Frontiers in Electronic Testing ; 31 Publication details: Boston, MA : Springer Science+Business Media, Inc., 2005 In: Springer e-books Online resources: Click here to access online Availability: No items available.
	4.	Fault Diagnosis of Analog Integrated Circuits [electronic resource] / by Prithviraj Kabisatpathy, Alok Barua, Satyabroto Sinha. by Kabisatpathy, Prithviraj Barua, Alok Sinha, Satyabroto SpringerLink (Online service) Series: Frontiers in Electronic Testing ; 30 Publication details: Boston, MA : Springer, 2005 In: Springer e-books Online resources: Click here to access online Availability: No items available.
	5.	Introduction to Advanced System-on-Chip Test Design and Optimization [electronic resource] / by Erik Larsson. by Larsson, Erik SpringerLink (Online service) Series: Frontiers in Electronic Testing ; 29 Publication details: Boston, MA : Springer, 2005 In: Springer e-books Online resources: Click here to access online Availability: No items available.
	6.	The Core Test Wrapper Handbook [electronic resource] : Rationale and Application of IEEE Std. 1500 / by Francisco Da Silva, Teresa McLaurin, Tom Waayers. by Da Silva, Francisco McLaurin, Teresa Waayers, Tom SpringerLink (Online service) Series: Frontiers in Electronic Testing ; 35 Publication details: Boston, MA : Springer Science+Business Media, LLC, 2006 In: Springer e-books Online resources: Click here to access online Availability: No items available.
	7.	Oscillation-Based Test in Mixed-Signal Circuits [electronic resource] / by Gloria Huertas Sanchez ... [et al.]. by Sanchez, Gloria Huertas SpringerLink (Online service) Series: Frontiers in Electronic Testing ; 36 Publication details: Dordrecht : Springer, 2006 In: Springer e-books Online resources: Click here to access online Availability: No items available.
	8.	Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits [electronic resource] : 2nd Edition / edited by Manoj Sachdev, Jose Pineda de Gyvez. by Sachdev, Manoj Gyvez, Jose Pineda de SpringerLink (Online service) Series: Frontiers in Electronic Testing ; 34 Publication details: Boston, MA : Springer, 2007 In: Springer e-books Online resources: Click here to access online Availability: Items available for loan: PERPUSTAKAAN TUN SERI LANANG (1)Call number: ebooks. Place hold
	9.	CMOS SRAM circuit design and parametric test in nano-scaled technologies [electronic resource] : process-aware SRAM design and test / by Andrei Pavlov, Manoj Sachdev. by Pavlov, Andrei Sachdev, Manoj SpringerLink (Online service) Series: Frontiers in electronic testing ; 40 Publication details: Dordrecht : Springer Science + Business Media B.V, 2008 In: Springer eBooks Online resources: Click here to access online Availability: No items available.
	10.	New methods of concurrent checking [electronic resource] / by Michael Goessel ... [et al.]. by Goessel, M SpringerLink (Online service) Series: Frontiers in electronic testing ; 42 Publication details: Dordrecht : Springer Science+Business Media B.V., 2008 In: Springer eBooks Online resources: Click here to access online Availability: No items available.
	11.	Emerging Nanotechnologies [electronic resource] : Test, Defect Tolerance, and Reliability / edited by Mohammad Tehranipoor. by Tehranipoor, Mohammad SpringerLink (Online service) Series: Frontiers in Electronic Testing ; 37 Publication details: Boston, MA : Springer Science+Business Media, LLC, 2008 In: Springer eBooks Online resources: Click here to access online Availability: No items available.
	12.	Digital Timing Measurements [electronic resource] : From Scopes and Probes to Timing and Jitter / by Wolfgang Maichen. by Maichen, Wolfgang SpringerLink (Online service) Series: Frontiers in Electronic Testing ; 33 Publication details: New York, NY : Springer US, 2006 In: Springer e-books Online resources: Click here to access online Availability: No items available.

Contact Us

Perpustakaan Tun Seri Lanang, Universiti Kebangsaan Malaysia
43600 Bangi, Selangor Darul Ehsan,Malaysia
+603-89213446 – Consultation Services
019-2045652 – Telegram/Whatsapp
Email: helpdeskptsl@ukm.edu.my

Copyright ©The National University of Malaysia Library