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	1.	Neural models and algorithms for digital testing / by Srimat T. Chakradhar, Vishwani D. Agrawal, Michael L. Bushnell. by Chakradhar, Srimat T Agrawal, Vishwani D, 1943- Bushnell, Michael L., (Michael Lee), 1950- Publication details: Boston : Kluwer Academic Publishers, 1991 Availability: Items available for loan: PERPUSTAKAAN LINGKUNGAN KEDUA (1)Call number: TK7868.L6 C44. Place hold
	2.	Tutorial, test generation for VLSI chips edited by Vishwani D. Agrawal and Sharad C. Seth by Agrawal, Vishwani D, 1943- Seth, Sharad C IEEE Computer Society Publication details: Washington, D.C. IEEE computer Society 1988 Availability: Items available for loan: PERPUSTAKAAN LINGKUNGAN KEDUA (1)Call number: TK7874.T8857. Place hold
	3.	Unified methods for VLSI simulation and test generation by Kwang-Ting Cheng and Vishwani D. Agrawal. by Cheng, Kwang-Ting, 1961- [author.] Agrawal, Vishwani D, 1943- [author.] Publication details: Boston: Kluwer Academic Publishers, 1989 Availability: Items available for loan: PERPUSTAKAAN LINGKUNGAN KEDUA (1)Call number: TK7874. C525. Place hold

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