Wafer level reliability of advanced CMOS devices and processes / Yi Zhao, editor

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Publication details: New York : Nova Science Publishers, 2008Description: 195 p. : ill. ; 27 cmISBN:

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Holdings
Item type	Current library	Home library	Collection	Call number	Materials specified	Copy number	Status	Date due	Barcode
AM	PERPUSTAKAAN LINGKUNGAN KEDUA	PERPUSTAKAAN LINGKUNGAN KEDUA KOLEKSI AM-P. LINGKUNGAN KEDUA	-	TK7871.99.M44W334 3 (Browse shelf(Opens below))		1	Available		00002054936

Includes bibliographical references and index

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