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Emerging Nanotechnologies [electronic resource] : Test, Defect Tolerance, and Reliability / edited by Mohammad Tehranipoor.

Contributor(s): Series: Frontiers in Electronic Testing ; 37Publication details: Boston, MA : Springer Science+Business Media, LLC, 2008.Description: xii, 405 p. : ill., digital ; 24 cmISBN:
  • 9780387747477 (electronic bk.)
  • 9780387747460 (paper)
Subject(s): DDC classification:
  • 620.5 22
LOC classification:
  • T174.7 .E44 2008
Online resources: In: Springer eBooks
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