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Electromigration in ULSI Interconnections / Cher Ming Tan.
Series: International series on advances in solid state electronics and technologyPublication details: Singapore ; World Scientific, 2010.Description: xix, 291 p. : ill. ; 24 cmISBN:- 9789814273329 (hbk.)
- 9814273325 (hbk.)
| Item type | Current library | Home library | Collection | Call number | Materials specified | Copy number | Status | Date due | Barcode | |
|---|---|---|---|---|---|---|---|---|---|---|
| AM | PERPUSTAKAAN LINGKUNGAN KEDUA | PERPUSTAKAAN LINGKUNGAN KEDUA KOLEKSI AM-P. LINGKUNGAN KEDUA | - | TK7874.76.T34 3 (Browse shelf(Opens below)) | 1 | Available | 00002034703 |
Includes bibliographical references and index.
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