Statistical analysis of fatique data : a symposium / sponsored by ASTM, Committee E-9 on Fatique, American Society for Testing and Materials, Pittsburgh, Pa., 30-31 Oct. 1979 R.E. Little and J.C. Ekval, editors.
Series: ASTM special technical publication ; 744.Publication details: Philadelphia : American Society for Testing and Materials, 1981.Description: 143 p. : ill. ; 23 cmSubject(s):| Item type | Current library | Home library | Collection | Call number | Materials specified | Copy number | Status | Date due | Barcode | |
|---|---|---|---|---|---|---|---|---|---|---|
| AM | PERPUSTAKAAN LINGKUNGAN KEDUA | PERPUSTAKAAN LINGKUNGAN KEDUA KOLEKSI AM-P. LINGKUNGAN KEDUA | - | TA418.38.S7 3 (Browse shelf(Opens below)) | 1 | Available | 00000075093 | |||
| AM | PERPUSTAKAAN TUN SERI LANANG | PERPUSTAKAAN TUN SERI LANANG KOLEKSI AM-P. TUN SERI LANANG (ARAS 5) | - | TA418.38.S7 3 (Browse shelf(Opens below)) | 1 | Discard | 00000366393 |
Includes bibliographical references and index.
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