Defect control in semiconductors : proceedings of the international conference on the science and technology of defect control in semiconductors, the Yokohama 21st century forum, Yokohama, Japan September 17-22, 1989 / edited by K. Sumino
Publication details: Amsterdam : North-Holland, 1990Description: v.: ill. ; 28 cmSubject(s):| Item type | Current library | Home library | Collection | Call number | Materials specified | Copy number | Status | Date due | Barcode | |
|---|---|---|---|---|---|---|---|---|---|---|
| AM | PERPUSTAKAAN TUN SERI LANANG | PERPUSTAKAAN TUN SERI LANANG PILIH SIMPAN-P. TUN SERI LANANG (ARAS 1) | - | QC611.6.D4I583 1989[00008027923] (Browse shelf(Opens below)) | j. 2 | 1 | Available | 00000283043 | ||
| AM | PERPUSTAKAAN TUN SERI LANANG | PERPUSTAKAAN TUN SERI LANANG PILIH SIMPAN-P. TUN SERI LANANG (ARAS 1) | - | QC611.6.D4I583 1989[00008027922] (Browse shelf(Opens below)) | j. 1 | 1 | Available | 00000283049 |
Includes bibliographical references and indexes
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