Defect control in semiconductors : proceedings of the international conference on the science and technology of defect control in semiconductors, the Yokohama 21st century forum, Yokohama, Japan September 17-22, 1989 / edited by K. Sumino

By: Contributor(s): Publication details: Amsterdam : North-Holland, 1990Description: v.: ill. ; 28 cmSubject(s):
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Item type Current library Home library Collection Call number Materials specified Copy number Status Date due Barcode
AM PERPUSTAKAAN TUN SERI LANANG PERPUSTAKAAN TUN SERI LANANG PILIH SIMPAN-P. TUN SERI LANANG (ARAS 1) - QC611.6.D4I583 1989[00008027923] (Browse shelf(Opens below)) j. 2 1 Available 00000283043
AM PERPUSTAKAAN TUN SERI LANANG PERPUSTAKAAN TUN SERI LANANG PILIH SIMPAN-P. TUN SERI LANANG (ARAS 1) - QC611.6.D4I583 1989[00008027922] (Browse shelf(Opens below)) j. 1 1 Available 00000283049

Includes bibliographical references and indexes

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