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	1.	No cover image available Modern developments in electron microscopy / edited by Benjamin M. Siegel. by Siegel, Benjamin M Publication details: New York : Academic Press, 1964 Availability: Items available for loan: PERPUSTAKAAN DR ABDUL LATIFF (1)Call number: QH205.S571m 1964 9. Place hold
	2.	Physical aspects of electron microscopy and microbeam analysis / edited by Benjamin M. Siegel, and Donald R. Beaman. by Siegel, Benjamin M Beaman, Donald Robert Electron Microscopy Society of America Microbeam Analysis Society Publication details: New York : Wiley, 1975 Availability: Items available for loan: PERPUSTAKAAN TUN SERI LANANG (1)Call number: QH212.E4S53. Place hold

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