Tutorial, test generation for VLSI chips edited by Vishwani D. Agrawal and Sharad C. Seth

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Publication details: Washington, D.C. IEEE computer Society 1988Description: x, 401 p. : ill. ; 29 cmISBN:

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Holdings
Item type	Current library	Home library	Collection	Call number	Materials specified	Copy number	Status	Date due	Barcode
AM	PERPUSTAKAAN LINGKUNGAN KEDUA	PERPUSTAKAAN LINGKUNGAN KEDUA KOLEKSI AM-P. LINGKUNGAN KEDUA	-	TK7874.T8857 (Browse shelf(Opens below))		1	Available		00000493624

Bibliography : p. 333-394

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