Value analysis tear-down : a new process for product development and innovation / Yoshihiko Sato and J. Jerry Kaufman

By: Contributor(s): Publication details: New York : Industrial Press, 2005Description: x, 206 p. : ill. ; 24 cmISBN:
  • 0831132035 (professional/textbook : alk. paper)
Subject(s): Online resources:
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Item type Current library Home library Collection Call number Materials specified Copy number Status Date due Barcode
AM PERPUSTAKAAN LINGKUNGAN KEDUA PERPUSTAKAAN LINGKUNGAN KEDUA KOLEKSI AM-P. LINGKUNGAN KEDUA - HD47.3.S38 3 (Browse shelf(Opens below)) 1 Available 00001477829

Includes bibliographical references (p. 199) and index

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