Thin oxide reliability in integrated circuits ( microform) / by Elyse Rosenbaum.
Publication details: Ann Arbor, Mich. : University Microfilms International, 1993.Description: 2 microfiches ; 11 x 15 cmSubject(s): Dissertation note: Thesis (Ph.D.) - University of California, 1992.| Item type | Current library | Home library | Collection | Call number | Materials specified | Copy number | Status | Date due | Barcode | |
|---|---|---|---|---|---|---|---|---|---|---|
| TERHAD | PERPUSTAKAAN TUN SERI LANANG | PERPUSTAKAAN TUN SERI LANANG MEDIA-P. TUN SERI LANANG (ARAS 2) | - | TK7874 .R67 1993 4mikrofis (Browse shelf(Opens below)) | 1 | Available | 00000718193 |
Thesis (Ph.D.) - University of California, 1992.
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