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Scan statistics [electronic resource] : methods and applications / edited by Joseph Glaz, Vladimir Pozdnyakov, Sylvan Wallenstein.

Contributor(s): Series: Statistics for industry and technologyPublication details: Boston : Birkhauser Boston, 2009.Description: xxviii, 394 pages : illustrations, digitalISBN:
  • 9780817647490
Subject(s): DDC classification:
  • 519.5 22
Online resources: In: Springer eBooks
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