Microelectronic reliability / Emiliano Pollino.

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Publication details: Norwood, Mass. : Artech House, 1989.Description: v. : ill. ; 23 cmISBN:

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Contents:

V.2 Integrity assessment and assurance.

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Holdings
Item type	Current library	Home library	Collection	Call number	Materials specified	Copy number	Status	Date due	Barcode
AM	PERPUSTAKAAN LINGKUNGAN KEDUA	PERPUSTAKAAN LINGKUNGAN KEDUA KOLEKSI AM-P. LINGKUNGAN KEDUA	-	TK7871.85.A3613 (Browse shelf(Opens below))	j.3	1	Available		00000175589

Translation of : L'affidabilita' dei componenti elettronici a semiconduttore

V.2 Integrity assessment and assurance.

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