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	1.	Accelerated testing : statistical models, test plans, and data analyses / Wayne Nelson by Nelson, Wayne, 1936- Series: Wiley series in probability and mathematical statistics. Applied probability and statistics Publication details: New York : John Wiley & Sons, 1990 Availability: Items available for loan: PERPUSTAKAAN TUN SERI LANANG (1)Call number: QA276.N45. Place hold
	2.	Applied life data analysis / Wayne Nelson. by Nelson, Wayne, 1936- Series: Wiley series in probability and mathematical statistics. Applied probability and statistics. Publication details: New York : Wiley, 1982 Availability: Items available for loan: PERPUSTAKAAN LINGKUNGAN KEDUA (2)Call number: TS173.N44 3, ... PERPUSTAKAAN TUN SERI LANANG (1)Call number: TS173.N44. Place hold
	3.	Applied life data analysis / Wayne B. Nelson by Nelson, Wayne, 1936- Series: Wiley series in probability and mathematical statistics \| Wiley-Interscience paperback series Publication details: Hoboken, N.J. : Wiley-Interscience, 2004 Online resources: Contributor biographical information Publisher description Table of contents Availability: Items available for loan: PERPUSTAKAAN DR ABDUL LATIFF (1)Call number: TS173.N44 2004. Place hold
	4.	Accelerated testing : statistical models, test plans, and data analyses / Wayne Nelson by Nelson, Wayne, 1936- Series: Wiley series in probability and mathematical statistics. Applied probability and statistics Edition: 2nd ed. Publication details: New York : John Wiley & Sons, 2004 Availability: No items available.

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