Testing for EMC compliance : approaches and techniques / Mark I. Montrose, Edward M. Nakauchi

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Publication details: Hoboken, NJ : John Wiley, 2004Description: xviii, 460 p. : ill. ; 24 cmISBN:

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Item type	Current library	Home library	Collection	Call number	Materials specified	Copy number	Status	Date due	Barcode
AM	ZZ	ZZ DEFAULT LOCATION	-	TK7867.2.M665 3 (Browse shelf(Opens below))		1	Available		00001360113

Includes bibliographical references (p. 447-451) and index

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