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	1.	No cover image available Fundamentals of surface and thin film analysis / by Leonard G. Feldman and James W. Mayer by Feldman, Leonard C Mayer, J. W. (James W.), 1930- Publication details: New York : North-Holland, 1986 Availability: Items available for loan: PERPUSTAKAAN TUN SERI LANANG (1)Call number: QD506.F39. Place hold
	2.	Ion beam handbook for material analysis / edited by J. W. Mayer & E. Rimini. by Mayer, J. W. (James W.), 1930- Rimini, E Publication details: New York : Academic Press, 1977 Availability: Items available for loan: PERPUSTAKAAN TUN SERI LANANG (1)Call number: QC702.I63. Place hold
	3.	Ion implantation in semiconductors silicon and germanium / by James W. Mayer, Lennart Eriksson and John A. Davies. by Mayer, J. W. (James W.), 1930- Eriksson, Lennart, 1938- Davies, John Arthur, 1927- Publication details: New York : Academic Press, 1970 Availability: Items available for loan: PERPUSTAKAAN LINGKUNGAN KEDUA (1)Call number: TK7871.85.M38. Place hold
	4.	Thin films-interdiffusion and reactions edited by J.M. Poate, K.N. Tu, J.W. Mayer sponsored by the Electrochemical Society, Inc. by Poate, J.M., 1940- Tu, K. N. (King-ning), 1937- Mayer, J. W. (James W.), 1930- Publication details: New York Wiley 1978 Availability: No items available.

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