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Metrology and standardization of nanotechnology : protocols and industrial innovations / edited by Elisabeth Mansfield, Debra L. Kaiser, Daisuke Fujita, and Marcel Van de Voorde.

Contributor(s): Series: Nanotechnology innovation & applicationsPublisher: Weinheim, Germany : Wiley-VCH, 2017Description: 1 online resourceContent type:
  • text
Media type:
  • computer
Carrier type:
  • online resource
ISBN:
  • 9783527800308
  • 3527800301
  • 3527800050
  • 9783527800056
Subject(s): Genre/Form: DDC classification:
  • 620/.5 23
LOC classification:
  • T174.7
Online resources: In: Wiley e-books
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Includes bibliographical references and index.

Online resource; title from PDF title page (John Wiley, viewed January 31, 2017).

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