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CCD Image Sensors in Deep-Ultraviolet [electronic resource] : Degradation Behavior and Damage Mechanisms / by Flora M. Li, Arokia Nathan.
Series: Microtechnology and MemsPublication details: Berlin, Heidelberg : Springer-Verlag Berlin Heidelberg, 2005.Description: 1online resource (xi, 231 p.) : ill., digital ; 25 cmISBN:- 9783540274124 (electronic bk.)
- 9783540226802 (paper)
- 621.364 22
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