Fundamental principles of engineering nanometrology / Professor Richard K. Leach

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Publication details: Oxford : William Andrew/Elsevier, 2010Description: xxvi, 321 p. : ill. ; 24 cmISBN:

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Holdings
Item type	Current library	Home library	Collection	Call number	Materials specified	Copy number	Status	Date due	Barcode
AM	PERPUSTAKAAN LINGKUNGAN KEDUA	PERPUSTAKAAN LINGKUNGAN KEDUA KOLEKSI AM-P. LINGKUNGAN KEDUA	-	T174.7.L434 3 (Browse shelf(Opens below))		1	Available		00002023978

Includes index

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