Radiation defects in ion implanted and/or high-energy irradiated MOS structures / S. Kaschieva and S.N. Dmitriev.

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Series: Electrical engineering developments seriesPublication details: New York : Nova Science Publishers, 2010.Description: ix, 195 p. : ill. (some col.) ; 24 cmISBN:

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Holdings
Item type	Current library	Home library	Collection	Call number	Materials specified	Copy number	Status	Date due	Barcode
AM	PERPUSTAKAAN TUN SERI LANANG	PERPUSTAKAAN TUN SERI LANANG KOLEKSI AM-P. TUN SERI LANANG (ARAS 5)	-	QC611.8.M4K377 (Browse shelf(Opens below))		1	Available		00002027954

Includes bibliographical references and index.

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