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	1.	Hot-carrier reliability of MOS VLSI circuits / by Yusuf Leblebici, Sung-Mo (Steve) Kang. by Leblebici, Yusuf Kang, Sung-Mo, 1945- Publication details: Boston, Mass. : Kluwer Academic Publishers, 1993 Availability: Items available for loan: PERPUSTAKAAN LINGKUNGAN KEDUA (1)Call number: TK7874.L334. Place hold
	2.	CMOS digital integrated circuits : analysis and design / Sung-Mo (Steve) Kang, Yusuf Leblebici. by Kang, Sung-Mo, 1945- Leblebici, Yusuf Edition: 2nd ed. Publication details: Boston, MA : McGraw-Hill, 1999 Availability: Not available: PERPUSTAKAAN TUN SERI LANANG: Checked out (1).

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