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	1.	Defect recognition and image processing in semiconductors and devices : proceedings of the Fifth International Conference, 6-10 September 1993 / edited by J. Jimenez by Jimenez, J International Symposium on Defect Recognition and Image Processing in III-V Compounds (5th : 1993 : Santander, Spain) Series: Institute of Physics conference series ; 135 Publication details: Bristol : Institute of Physics, 1994 Availability: Items available for loan: PERPUSTAKAAN LINGKUNGAN KEDUA (1)Call number: TK7871.85.D454. Place hold
	2.	Microprobe characterization of optoelectronic materials / edited by Juan Jimenez. by Jimenez, J. (Juan) Series: Optoelectronic properties of semiconductors and superlattices ; vol. 17. Publication details: New York : Taylor & Francis, 2003 Availability: Items available for loan: PERPUSTAKAAN TUN SERI LANANG (1)Call number: QC611.6.O6M52. Place hold

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