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Data Mining and Diagnosing IC Fails [electronic resource] / by Leendert M. Huisman.
Series: Frontiers in Electronic Testing ; 31Publication details: Boston, MA : Springer Science+Business Media, Inc., 2005.Description: 270 p. : ill., digital ; 24 cmISBN:- 9780387263519 (electronic bk.)
- 9780387249933 (paper)
- 621.381548 22
- TK7874 .H85 2005
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