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Structured built-in test for LSI/VLSI chips based on random patterns (microform) / Hsu Yi-Jen.

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Publication details: Ann Arbor, Mich.: University Microfilms International, 1986.Description: 2 microfiches ; 11 x 15 cmSubject(s):

Dissertation note: Thesis (Ph.D.)-Auburn University, 1986

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Holdings
Item type	Current library	Home library	Collection	Call number	Materials specified	Copy number	Status	Date due	Barcode
TERHAD	PERPUSTAKAAN TUN SERI LANANG	PERPUSTAKAAN TUN SERI LANANG MEDIA-P. TUN SERI LANANG (ARAS 2)	-	TK7874.75.H78 1986 4mikrofis (Browse shelf(Opens below))		1	Available		00000027190

Thesis (Ph.D.)-Auburn University, 1986

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