Amazon cover image
Image from Amazon.com

Scanning Probe Microscopy [electronic resource] : Atomic Scale Engineering by Forces and Currents / by Adam Foster, Werner Hofer.

By: Contributor(s): Series: NanoScience and TechnologyPublication details: New York, NY : Springer Science+Business Media, LLC, 2006.Description: xiv, 281 pages : illustration, digital ; 25 cmISBN:
  • 9780387372310 (electronic bk.)
Subject(s): DDC classification:
  • 502.82 22
LOC classification:
  • QH212.S33 F68 2006
Online resources: In: Springer e-books
Tags from this library: No tags from this library for this title. Log in to add tags.
Star ratings
    Average rating: 0.0 (0 votes)
No physical items for this record

There are no comments on this title.

to post a comment.

Contact Us

Perpustakaan Tun Seri Lanang, Universiti Kebangsaan Malaysia
43600 Bangi, Selangor Darul Ehsan,Malaysia
+603-89213446 – Consultation Services
019-2045652 – Telegram/Whatsapp
Email: helpdeskptsl@ukm.edu.my

Copyright ©The National University of Malaysia Library